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Chip Error Resilience
Stealth ECC: A Data-Width Aware Adaptive ECC Scheme for DRAM Error Resilience
As DRAM process technology scales down and DRAM density continues to grow, DRAM errors have become a primary concern in modern data …
Young Seo Lee
,
Gunjae Koo
,
Young-Ho Gong
,
Sung Woo Chung
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